Atom Probe Microscopy Book
Score: 5
From 2 Ratings

Atom Probe Microscopy


  • Author : Baptiste Gault
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-08-27
  • Genre: Technology & Engineering
  • Pages : 396
  • ISBN 10 : 9781461434368

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Atom Probe Microscopy Excerpt :

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.

Atom Probe Tomography Book

Atom Probe Tomography


  • Author : Williams Lefebvre
  • Publisher : Academic Press
  • Release Date : 2016-05-30
  • Genre: Technology & Engineering
  • Pages : 416
  • ISBN 10 : 9780128047453

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Atom Probe Tomography Excerpt :

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process. Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials Written for both experienced researchers and new users Includes exercises, along with corrections, for users to practice the techniques discussed Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Atom Probe Field Ion Microscopy Book

Atom Probe Field Ion Microscopy


  • Author : Tien T. Tsong
  • Publisher : Cambridge University Press
  • Release Date : 2005-09-15
  • Genre: Science
  • Pages : 400
  • ISBN 10 : 0521019931

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Atom Probe Field Ion Microscopy Excerpt :

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same resolution, there are some experiments unique to field ion microscopy--for example the study of the behavior of single atoms and clusters on a solid surface. The very elegant development of the field ion microscope with the atom-probe has provided a powerful and useful technique for highly sensitive chemical analysis. This book presents the basic principles of atom-probe field ion microscopy and illustrates the various capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

Atom Probe Tomography Book

Atom Probe Tomography


  • Author : Michael K. Miller
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-12-06
  • Genre: Technology & Engineering
  • Pages : 239
  • ISBN 10 : 9781461542810

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Atom Probe Tomography Excerpt :

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Local Electrode Atom Probe Tomography Book
Score: 5
From 1 Ratings

Local Electrode Atom Probe Tomography


  • Author : David J. Larson
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-12-12
  • Genre: Technology & Engineering
  • Pages : 318
  • ISBN 10 : 9781461487210

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Local Electrode Atom Probe Tomography Excerpt :

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.

Atom Probe Tomography Book

Atom Probe Tomography


  • Author : Michael K. Miller
  • Publisher : Springer
  • Release Date : 2014-07-31
  • Genre: Technology & Engineering
  • Pages : 423
  • ISBN 10 : 9781489974303

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Atom Probe Tomography Excerpt :

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

Atom Probe Field Ion Microscopy Book

Atom Probe Field Ion Microscopy


  • Author : Michael Kenneth Miller
  • Publisher : Oxford University Press on Demand
  • Release Date : 1996
  • Genre: Biography & Autobiography
  • Pages : 509
  • ISBN 10 : 0198513879

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Atom Probe Field Ion Microscopy Excerpt :

A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

Roadmap of Scanning Probe Microscopy Book
Score: 5
From 1 Ratings

Roadmap of Scanning Probe Microscopy


  • Author : Seizo Morita
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-12-30
  • Genre: Technology & Engineering
  • Pages : 201
  • ISBN 10 : 9783540343158

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Roadmap of Scanning Probe Microscopy Excerpt :

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Scanning Probe Microscopy Book

Scanning Probe Microscopy


  • Author : Bert Voigtländer
  • Publisher : Springer
  • Release Date : 2015-02-24
  • Genre: Technology & Engineering
  • Pages : 382
  • ISBN 10 : 9783662452400

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Scanning Probe Microscopy Excerpt :

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Scanning Probe Microscopy Book

Scanning Probe Microscopy


  • Author : Ernst Meyer
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-03-14
  • Genre: Science
  • Pages : 210
  • ISBN 10 : 9783662098011

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Scanning Probe Microscopy Excerpt :

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Introduction to Scanning Tunneling Microscopy Book

Introduction to Scanning Tunneling Microscopy


  • Author : C. Julian Chen
  • Publisher : Oxford University Press on Demand
  • Release Date : 1993
  • Genre: Science
  • Pages : 412
  • ISBN 10 : 9780195071504

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Introduction to Scanning Tunneling Microscopy Excerpt :

A graduate-level introduction to scanning tunnelling microscopy, which explains how the method's ability to map microscopic surfaces non-destructively has found major applications in physics, surface science, materials science, biology, chemistry and engineering.

Microstructural Geochronology Book

Microstructural Geochronology


  • Author : Desmond E. Moser
  • Publisher : John Wiley & Sons
  • Release Date : 2017-11-23
  • Genre: Science
  • Pages : 402
  • ISBN 10 : 9781119227359

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Microstructural Geochronology Excerpt :

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive parent and daughter atoms themselves, to generate a microstructural geochronology from some of the most resilient materials in the solar system. First compilation of research focusing on the crystal structure, material properties, and chemical zoning of the geochronology mineral archive down to nanoscale Novel comparisons of mineral time archives from different rocky planets and asteroids and their shock metamorphic histories Fundamentals on how to reconstruct and date radiogenic isotope distributions using atom probe tomography Microstructural Geochronology will be a valuable resource for graduate students, academics, and researchers in the fields of petrology, geochronology, mineralogy, geochemistry, planetary geology, astrobiology, chemistry, and material science. It will also appeal to philosophers and historians of science from other disciplines.

Microscopy of Semiconducting Materials 1983  Third Oxford Conference on Microscopy of Semiconducting Materials  St Catherines College  March 1983 Book

Microscopy of Semiconducting Materials 1983 Third Oxford Conference on Microscopy of Semiconducting Materials St Catherines College March 1983


  • Author : A.G. Cullis
  • Publisher : CRC Press
  • Release Date : 2020-11-25
  • Genre: Science
  • Pages : 300
  • ISBN 10 : 9781000112160

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Microscopy of Semiconducting Materials 1983 Third Oxford Conference on Microscopy of Semiconducting Materials St Catherines College March 1983 Excerpt :

This volume contains invited and contributed papers at the conference on Microscopy of Semiconducting Materials which took place on 21–23 March 1983 in St Cathernine's College, Oxford. The conference was the third in the series devoted to advances in microscopical studies of semiconductors.

Handbook of Microscopy for Nanotechnology Book

Handbook of Microscopy for Nanotechnology


  • Author : Nan Yao
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-07-12
  • Genre: Technology & Engineering
  • Pages : 731
  • ISBN 10 : 9781402080067

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Handbook of Microscopy for Nanotechnology Excerpt :

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.

Surface Science Tools for Nanomaterials Characterization Book

Surface Science Tools for Nanomaterials Characterization


  • Author : Challa S.S.R. Kumar
  • Publisher : Springer
  • Release Date : 2015-03-10
  • Genre: Science
  • Pages : 652
  • ISBN 10 : 9783662445518

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Surface Science Tools for Nanomaterials Characterization Excerpt :

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.