Electron Beam Analysis of Materials Book

Electron Beam Analysis of Materials

  • Author : M. H. Loretto
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-12-06
  • Genre: Science
  • Pages : 210
  • ISBN 10 : 9789400955400

Electron Beam Analysis of Materials Excerpt :

The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a specific application have been available and correspondingly most of the available textbooks tend to have covered the theory and practice of an individual technique. There appears to be no doubt that dedicated instru ments taken together with the specialized textbooks will continue to be the appropriate approach for some problems. Nevertheless the underlying electron-specimen interactions are common to many techniques and in view of the fact that a range of hybrid instruments is now available it seems appropriate to provide a broad-based text for users of these electron beam facilities. The aim of the present book is therefore to provide, in a reasonably concise form, the material which will allow the practitioner of one or more of the individual techniques to appreciate and to make use of the type of information which can be obtained using other electron beam techniques.

The Local Chemical Analysis of Materials Book

The Local Chemical Analysis of Materials

  • Author : J. W. Martin
  • Publisher : Elsevier
  • Release Date : 2003-10-31
  • Genre: Science
  • Pages : 234
  • ISBN 10 : 0080535577

The Local Chemical Analysis of Materials Excerpt :

* Expert, up-to-date guidance on the appropriate techniques of local chemical analysis * Comprehensive. This volume is an ideal starting point for material research and development, bringing together a number of techniques usually only found in isolation * Recent examples of the applications of techniques are provided in all cases Helping to solve the problems of materials scientists in academia and industry, this book offers guidance on appropriate techniques of chemical analysis of materials at the local level, down to the atomic scale. Comparisons are made between various techniques in terms of the nature of the probe employed. The detection limit and the optimum spatial resolution is also considered, as well as the range of atomic number that may be identified and the precision and methods of calibration, where appropriate. The Local Chemical Analysis of Materials is amply illustrated allowing the reader to easily see typical results. It includes a comparative table of techniques to aid selection for analysis and a table of acronyms, particularly valuable in this jargon-riddled area.

MIME 569 December 2009 Book

MIME 569 December 2009

  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 2009
  • Genre: Uncategoriezed
  • Pages : null
  • ISBN 10 : OCLC:1126308729

MIME 569 December 2009 Excerpt :

Combinatorial Materials Synthesis Book

Combinatorial Materials Synthesis

  • Author : Xiao-Dong Xiang
  • Publisher : CRC Press
  • Release Date : 2003-08-19
  • Genre: Science
  • Pages : 496
  • ISBN 10 : 0824741196

Combinatorial Materials Synthesis Excerpt :

Pioneered by the pharmaceutical industry and adapted for the purposes of materials science and engineering, the combinatorial method is now widely considered a watershed in the accelerated discovery, development, and optimization of new materials. Combinatorial Materials Synthesis reveals the gears behind combinatorial materials chemistry and thin-film technology, and discusses the prime techniques involved in synthesis and property determination for experimentation with a variety of materials. Funneling historic innovations into one source, the book explores core approaches to synthesis and rapid characterization techniques for work with combinatorial materials libraries.

An Introduction to Beam Physics Book

An Introduction to Beam Physics

  • Author : Martin Berz
  • Publisher : CRC Press
  • Release Date : 2014-12-03
  • Genre: Science
  • Pages : 324
  • ISBN 10 : 0750308087

An Introduction to Beam Physics Excerpt :

The field of beam physics touches many areas of physics, engineering, and the sciences. In general terms, beams describe ensembles of particles with initial conditions similar enough to be treated together as a group so that the motion is a weakly nonlinear perturbation of a chosen reference particle. Particle beams are used in a variety of areas, ranging from electron microscopes, particle spectrometers, medical radiation facilities, powerful light sources, and astrophysics to large synchrotrons and storage rings such as the LHC at CERN. An Introduction to Beam Physics is based on lectures given at Michigan State University’s Department of Physics and Astronomy, the online VUBeam program, the U.S. Particle Accelerator School, the CERN Academic Training Programme, and various other venues. It is accessible to beginning graduate and upper-division undergraduate students in physics, mathematics, and engineering. The book begins with a historical overview of methods for generating and accelerating beams, highlighting important advances through the eyes of their developers using their original drawings. The book then presents concepts of linear beam optics, transfer matrices, the general equations of motion, and the main techniques used for single- and multi-pass systems. Some advanced nonlinear topics, including the computation of aberrations and a study of resonances, round out the presentation.

Electron Beam Microanalysis Book

Electron Beam Microanalysis

  • Author : Anonim
  • Publisher : ASTM International
  • Release Date : 2022-05-17
  • Genre: Uncategoriezed
  • Pages : null
  • ISBN 10 : 978186723xxxx

Electron Beam Microanalysis Excerpt :

Beam Effects  Surface Topography  and Depth Profiling in Surface Analysis Book

Beam Effects Surface Topography and Depth Profiling in Surface Analysis

  • Author : Alvin W. Czanderna
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-04-11
  • Genre: Technology & Engineering
  • Pages : 430
  • ISBN 10 : 9780306469145

Beam Effects Surface Topography and Depth Profiling in Surface Analysis Excerpt :

Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Ion Beams for Materials Analysis Book

Ion Beams for Materials Analysis

  • Author : R. Curtis Bird
  • Publisher : Elsevier
  • Release Date : 1990-02-05
  • Genre: Science
  • Pages : 719
  • ISBN 10 : 9780080916897

Ion Beams for Materials Analysis Excerpt :

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.

The Basics of Crystallography and Diffraction Book

The Basics of Crystallography and Diffraction

  • Author : Christopher Hammond
  • Publisher : International Union of Crystallography Texts on Crystallography
  • Release Date : 2015
  • Genre: Science
  • Pages : 519
  • ISBN 10 : 9780198738688

The Basics of Crystallography and Diffraction Excerpt :

" International Union of Crystallography."

Identification of Textile Fibers Book

Identification of Textile Fibers

  • Author : M M Houck
  • Publisher : Elsevier
  • Release Date : 2009-01-30
  • Genre: Technology & Engineering
  • Pages : 396
  • ISBN 10 : 9781845695651

Identification of Textile Fibers Excerpt :

The identification of fibers is important to the textile industry, forensic science, fashion designers and historians among others. Identifying fibers involves observing the physical and chemical properties of the fiber for which there are a wide diversity of instruments available. This book provides a comprehensive review of fiber structure, the diversity of instruments available to identify fibers and applicications for a range of industries. The first part of the book examines the main fibers, their structure and characteristics. Part two focuses on methods of fiber identification, ranging from microscopic to DNA analysis. Specific applications, including how textiles are identified in forensic investigations. Identification of textile fibers is an important text for forensic scientists, police and lawyers who may be involved with the use of textile fibers to provide evidence in criminal cases. It will also be relevant for textile designers, technologists and inspectors wishing to assess fiber quality and understand fiber damage. Provides a comprehensive review of the main types of fibre together with their structure, characteristics and identification Assesses methods of fibre identification from optical microscopy to DNA analysis as well as instruments available to identify fibres

Systematic Materials Analysis Book

Systematic Materials Analysis

  • Author : J.H. Richardson
  • Publisher : Elsevier
  • Release Date : 2012-12-02
  • Genre: Science
  • Pages : 284
  • ISBN 10 : 9780323157728

Systematic Materials Analysis Excerpt :

Systematic Materials Analysis, Volume II presents a broad range of instrumental methods and approaches that will yield the desired information about a given material. This book serves as a guide for the purchase of new instrumentation. Organized into nine chapters, this volume starts with an overview of the analytical methods on the bases of specimen limitations and information desired by using flow charts encompassing the various instruments. This book then proceeds with a discussion of the specific instruments that outline the theories of operation. Other chapters consider the capability of the methods for quantitative and qualitative measurements of structure, texture, and chemical composition. This text discusses as well the selectivity and sensitivity of each method. The final chapter deals with X-ray photoelectron spectroscopy and provides a listing of known manufacturers of commercial ESCA (Electron Spectroscopy for Chemical Analysis) instrumentation. Materials analysts, laboratory administrator, biological scientists, engineers, and researchers will find this book extremely useful.

Electron Microbeam Analysis Book

Electron Microbeam Analysis

  • Author : Abraham Boekestein
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-12-06
  • Genre: Science
  • Pages : 278
  • ISBN 10 : 9783709166796

Electron Microbeam Analysis Excerpt :

This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of research in Europe were duly represented, but a definite trend is discernible. EPMA with wavelength-dispersive spectrometry (WDS) or energy-dispersive spectrometry (EDS) is the method with by far the widest range of applications, followed by TEM with EELS and then AES. There are also interesting suggestions for the further development of new appa ratus with new fields of application. Applications are heavily biased towards materials science (thin films in microelectronics and semicon ductors), ceramics and metallurgy, followed by analysis of biological and mineral samples.