Reliability Prediction from Burn In Data Fit to Reliability Models Book

Reliability Prediction from Burn In Data Fit to Reliability Models


  • Author : Joseph Bernstein
  • Publisher : Academic Press
  • Release Date : 2014-03-06
  • Genre: Technology & Engineering
  • Pages : 108
  • ISBN 10 : 9780128008195

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Reliability Prediction from Burn In Data Fit to Reliability Models Excerpt :

This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. The ability to include reliability calculations and test results in their product design The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions Have accurate failure rate calculations for calculating warrantee period replacement costs

Reliability Prediction from Burn In Data Fit to Reliability Models Book

Reliability Prediction from Burn In Data Fit to Reliability Models


  • Author : Joseph Bernstein
  • Publisher : Unknown
  • Release Date : 2014-03-07
  • Genre: Technology & Engineering
  • Pages : 108
  • ISBN 10 : 0128007478

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Reliability Prediction from Burn In Data Fit to Reliability Models Excerpt :

This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. . The ability to include reliability calculations and test results in their product design . The ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions . Have accurate failure rate calculations for calculating warrantee period replacement costs.

Reliability and Physics of Healthy in Mechatronics Book

Reliability and Physics of Healthy in Mechatronics


  • Author : Abdelkhalak El Hami
  • Publisher : John Wiley & Sons
  • Release Date : 2023-01-12
  • Genre: Technology & Engineering
  • Pages : 324
  • ISBN 10 : 9781786308818

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Reliability and Physics of Healthy in Mechatronics Excerpt :

This book illustrates simply, but with many details, the state of the art of reliability science, exploring clear reliability disciplines and applications through concrete examples from their industries and from real life, based on industrial experiences. Many experts believe that reliability is not only a matter of statistics but is a multidisciplinary scientific topic, involving materials, tests, simulations, quality tools, manufacturing, electronics, mechatronics, environmental engineering and Big Data, among others. For a complex mechatronic system, failure risks have to be identified at an early stage of the design. In the automotive and aeronautic industries, fatigue simulation is used both widely and efficiently. Problems arise from the variability of inputs such as fatigue parameters and life curves. This book aims to discuss probabilistic fatigue and reliability simulation. To do this, Reliability and Physics-of-Healthy in Mechatronics provides a study on some concepts of a predictive reliability model of microelectronics, with examples from the automotive, aeronautic and space industries, based on entropy and Physics-of-Healthy

Reliability Engineering Book

Reliability Engineering


  • Author : Elsayed A. Elsayed
  • Publisher : John Wiley & Sons
  • Release Date : 2021-01-07
  • Genre: Technology & Engineering
  • Pages : 930
  • ISBN 10 : 9781119665922

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Reliability Engineering Excerpt :

Get a firm handle on the engineering reliability process with this insightful and complete resource Named one of the Best Industrial Management eBooks of All Time by BookAuthority As featured on CNN, Forbes and Inc – BookAuthority identifies and rates the best books in the world, based on recommendations by thought leaders and experts The newly and thoroughly revised 3rd Edition of Reliability Engineering delivers a comprehensive and insightful analysis of this crucial field. Accomplished author, professor, and engineer, Elsayed. A. Elsayed includes new examples and end-of-chapter problems to illustrate concepts, new chapters on resilience and the physics of failure, revised chapters on reliability and hazard functions, and more case studies illustrating the approaches and methodologies described within. The book combines analyses of system reliability estimation for time independent and time dependent models with the construction of the likelihood function and its use in estimating the parameters of failure time distribution. It concludes by addressing the physics of failures, mechanical reliability, and system resilience, along with an explanation of how to ensure reliability objectives by providing preventive and scheduled maintenance and warranty policies. This new edition of Reliability Engineering covers a wide range of topics, including: Reliability and hazard functions, like the Weibull Model, the Exponential Model, the Gamma Model, and the Log-Logistic Model, among others System reliability evaluations, including parallel-series, series-parallel, and mixed parallel systems The concepts of time- and failure-dependent reliability within both repairable and non-repairable systems Parametric reliability models, including types of censoring, and the Exponential, Weibull, Lognormal, Gamma, Extreme Value, Half-Logistic, and Rayleigh Distributions Perfect for first-year graduate students in industrial and systems engineering, Reliability Engineering, 3rd Edition

System Reliability Book

System Reliability


  • Author : Constantin Volosencu
  • Publisher : BoD – Books on Demand
  • Release Date : 2017-12-20
  • Genre: Technology & Engineering
  • Pages : 398
  • ISBN 10 : 9789535137054

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System Reliability Excerpt :

Researchers from the entire world write to figure out their newest results and to contribute new ideas or ways in the field of system reliability and maintenance. Their articles are grouped into four sections: reliability, reliability of electronic devices, power system reliability and feasibility and maintenance. The book is a valuable tool for professors, students and professionals, with its presentation of issues that may be taken as examples applicable to practical situations. Some examples defining the contents can be highlighted: system reliability analysis based on goal-oriented methodology; reliability design of water-dispensing systems; reliability evaluation of drivetrains for off-highway machines; extending the useful life of asset; network reliability for faster feasibility decision; analysis of standard reliability parameters of technical systems' parts; cannibalisation for improving system reliability; mathematical study on the multiple temperature operational life testing procedure, for electronic industry; reliability prediction of smart maximum power point converter in photovoltaic applications; reliability of die interconnections used in plastic discrete power packages; the effects of mechanical and electrical straining on performances of conventional thick-film resistors; software and hardware development in the electric power system; electric interruptions and loss of supply in power systems; feasibility of autonomous hybrid AC/DC microgrid system; predictive modelling of emergency services in electric power distribution systems; web-based decision-support system in the electric power distribution system; preventive maintenance of a repairable equipment operating in severe environment; and others.

Reliability  Yield  and Stress Burn In Book

Reliability Yield and Stress Burn In


  • Author : Way Kuo
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-11-27
  • Genre: Technology & Engineering
  • Pages : 394
  • ISBN 10 : 9781461556718

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Reliability Yield and Stress Burn In Excerpt :

The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

Safety and Reliability  Methodology and Applications Book

Safety and Reliability Methodology and Applications


  • Author : Tomasz Nowakowski
  • Publisher : CRC Press
  • Release Date : 2014-09-01
  • Genre: Technology & Engineering
  • Pages : 408
  • ISBN 10 : 9781315736976

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Safety and Reliability Methodology and Applications Excerpt :

Within the last fifty years the performance requirements for technical objects and systems were supplemented with: customer expectations (quality), abilities to prevent the loss of the object properties in operation time (reliability and maintainability), protection against the effects of undesirable events (safety and security) and the ability to

Reliability Book

Reliability


  • Author : Wallace R. Blischke
  • Publisher : John Wiley & Sons
  • Release Date : 2011-09-20
  • Genre: Technology & Engineering
  • Pages : 848
  • ISBN 10 : 9781118150474

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Reliability Excerpt :

Bringing together business and engineering to reliability analysisWith manufactured products exploding in numbers and complexity,reliability studies play an increasingly critical role throughout aproduct's entire life cycle-from design to post-sale support.Reliability: Modeling, Prediction, and Optimization presents aremarkably broad framework for the analysis of the technical andcommercial aspects of product reliability, integrating concepts andmethodologies from such diverse areas as engineering, materialsscience, statistics, probability, operations research, andmanagement. Written in plain language by two highly respectedexperts in the field, this practical work provides engineers,operations managers, and applied statisticians with bothqualitative and quantitative tools for solving a variety ofcomplex, real-world reliability problems. A wealth of examples andcase studies accompanies: * Comprehensive coverage of assessment, prediction, and improvementat each stage of a product's life cycle * Clear explanations of modeling and analysis for hardware rangingfrom a single part to whole systems * Thorough coverage of test design and statistical analysis ofreliability data * A special chapter on software reliability * Coverage of effective management of reliability, product support,testing, pricing, and related topics * Lists of sources for technical information, data, and computerprograms * Hundreds of graphs, charts, and tables, as well as over 500references * PowerPoint slides are available from the Wiley editorialdepartment.

Thermal and Power Management of Integrated Circuits Book

Thermal and Power Management of Integrated Circuits


  • Author : Arman Vassighi
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-06-01
  • Genre: Technology & Engineering
  • Pages : 182
  • ISBN 10 : 9780387297491

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Thermal and Power Management of Integrated Circuits Excerpt :

In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.

Lifetime Data  Models in Reliability and Survival Analysis Book

Lifetime Data Models in Reliability and Survival Analysis


  • Author : Nicholas P. Jewell
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-04-17
  • Genre: Mathematics
  • Pages : 410
  • ISBN 10 : 9781475756548

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Lifetime Data Models in Reliability and Survival Analysis Excerpt :

Statistical models and methods for lifetime and other time-to-event data are widely used in many fields, including medicine, the environmental sciences, actuarial science, engineering, economics, management, and the social sciences. For example, closely related statistical methods have been applied to the study of the incubation period of diseases such as AIDS, the remission time of cancers, life tables, the time-to-failure of engineering systems, employment duration, and the length of marriages. This volume contains a selection of papers based on the 1994 International Research Conference on Lifetime Data Models in Reliability and Survival Analysis, held at Harvard University. The conference brought together a varied group of researchers and practitioners to advance and promote statistical science in the many fields that deal with lifetime and other time-to-event-data. The volume illustrates the depth and diversity of the field. A few of the authors have published their conference presentations in the new journal Lifetime Data Analysis (Kluwer Academic Publishers).

Official  ISC 2   Guide to the CISSP   ISSEP   CBK   Book

Official ISC 2 Guide to the CISSP ISSEP CBK


  • Author : Susan Hansche
  • Publisher : CRC Press
  • Release Date : 2005-09-29
  • Genre: Computers
  • Pages : 814
  • ISBN 10 : 9781420031355

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Official ISC 2 Guide to the CISSP ISSEP CBK Excerpt :

The Official (ISC)2® Guide to the CISSP®-ISSEP® CBK® provides an inclusive analysis of all of the topics covered on the newly created CISSP-ISSEP Common Body of Knowledge. The first fully comprehensive guide to the CISSP-ISSEP CBK, this book promotes understanding of the four ISSEP domains: Information Systems Security Engineering (ISSE); Certification and Accreditation; Technical Management; and an Introduction to United States Government Information Assurance Regulations. This volume explains ISSE by comparing it to a traditional Systems Engineering model, enabling you to see the correlation of how security fits into the design and development process for information systems. It also details key points of more than 50 U.S. government policies and procedures that need to be understood in order to understand the CBK and protect U.S. government information. About the Author Susan Hansche, CISSP-ISSEP is the training director for information assurance at Nortel PEC Solutions in Fairfax, Virginia. She has more than 15 years of experience in the field and since 1998 has served as the contractor program manager of the information assurance training program for the U.S. Department of State.

Reliability Assessments Book

Reliability Assessments


  • Author : Franklin Richard Nash, Ph.D.
  • Publisher : CRC Press
  • Release Date : 2017-07-12
  • Genre: Business & Economics
  • Pages : 749
  • ISBN 10 : 9781315353845

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Reliability Assessments Excerpt :

This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.

Technical Safety  Reliability and Resilience Book

Technical Safety Reliability and Resilience


  • Author : Ivo Häring
  • Publisher : Springer Nature
  • Release Date : 2021-03-17
  • Genre: Technology & Engineering
  • Pages : 308
  • ISBN 10 : 9789813342729

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Technical Safety Reliability and Resilience Excerpt :

This book provides basics and selected advanced insights on how to generate reliability, safety and resilience within (socio) technical system developments. The focus is on working definitions, fundamental development processes, safety development processes and analytical methods on how to support such schemes. The method families of Hazard Analyses, Failure Modes and Effects Analysis and Fault Tree Analysis are explained in detail. Further main topics include semiformal graphical system modelling, requirements types, hazard log, reliability prediction standards, techniques and measures for reliable hardware and software with respect to systematic and statistical errors, and combination options of methods. The book is based on methods as applied during numerous applied research and development projects and the support and auditing of such projects, including highly safety-critical automated and autonomous systems. Numerous questions and answers challenge students and practitioners.

Reliability Growth Book

Reliability Growth


  • Author : Panel on Reliability Growth Methods for Defense Systems
  • Publisher : National Academy Press
  • Release Date : 2015-03-01
  • Genre: Technology & Engineering
  • Pages : 235
  • ISBN 10 : 0309314747

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Reliability Growth Excerpt :

A high percentage of defense systems fail to meet their reliability requirements. This is a serious problem for the U.S. Department of Defense (DOD), as well as the nation. Those systems are not only less likely to successfully carry out their intended missions, but they also could endanger the lives of the operators. Furthermore, reliability failures discovered after deployment can result in costly and strategic delays and the need for expensive redesign, which often limits the tactical situations in which the system can be used. Finally, systems that fail to meet their reliability requirements are much more likely to need additional scheduled and unscheduled maintenance and to need more spare parts and possibly replacement systems, all of which can substantially increase the life-cycle costs of a system. Beginning in 2008, DOD undertook a concerted effort to raise the priority of reliability through greater use of design for reliability techniques, reliability growth testing, and formal reliability growth modeling, by both the contractors and DOD units. To this end, handbooks, guidances, and formal memoranda were revised or newly issued to reduce the frequency of reliability deficiencies for defense systems in operational testing and the effects of those deficiencies. "Reliability Growth" evaluates these recent changes and, more generally, assesses how current DOD principles and practices could be modified to increase the likelihood that defense systems will satisfy their reliability requirements. This report examines changes to the reliability requirements for proposed systems; defines modern design and testing for reliability; discusses the contractor's role in reliability testing; and summarizes the current state of formal reliability growth modeling. The recommendations of "Reliability Growth" will improve the reliability of defense systems and protect the health of the valuable personnel who operate them.