Reliability  Robustness and Failure Mechanisms of LED Devices Book

Reliability Robustness and Failure Mechanisms of LED Devices


  • Author : Yannick Deshayes
  • Publisher : Elsevier
  • Release Date : 2017-03-27
  • Genre: Technology & Engineering
  • Pages : 172
  • ISBN 10 : 9780081010884

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Reliability Robustness and Failure Mechanisms of LED Devices Excerpt :

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Reliability Investigation of LED Devices for Public Light Applications Book

Reliability Investigation of LED Devices for Public Light Applications


  • Author : Raphael Baillot
  • Publisher : Elsevier
  • Release Date : 2017-03-09
  • Genre: Technology & Engineering
  • Pages : 222
  • ISBN 10 : 9780081010921

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Reliability Investigation of LED Devices for Public Light Applications Excerpt :

Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. Based on the work of two main Phd results in 2011 and 2014 Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model Proposes the technology and methodologies to understand failure mechanisms

Nitride Semiconductor Light Emitting Diodes  LEDs  Book

Nitride Semiconductor Light Emitting Diodes LEDs


  • Author : Jian-Jang Huang
  • Publisher : Woodhead Publishing
  • Release Date : 2017-10-24
  • Genre: Technology & Engineering
  • Pages : 822
  • ISBN 10 : 9780081019436

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Nitride Semiconductor Light Emitting Diodes LEDs Excerpt :

Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications, Second Edition reviews the fabrication, performance and applications of the technology, encompassing the state-of-the-art material and device development, along with considerations regarding nitride-based LED design. This updated edition is based on the latest research and advances, including two new chapters on LEDs for large displays and laser lighting. Chapters cover molecular beam epitaxy (MBE) growth of nitride semiconductors, modern metalorganic chemical vapor deposition (MOCVD) techniques, the growth of nitride-based materials, and gallium nitride (GaN)-on-sapphire and GaN-on-silicon technologies for LEDs. Nanostructured, non-polar and semi-polar nitride-based LEDs, as well as phosphor-coated nitride LEDs, are also discussed. The book also addresses the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots. Further chapters discuss the development of LED encapsulation technology and fundamental efficiency droop issues in gallium indium nitride (GaInN) LEDs. It is a technical resource for academics, physicists, materials scientists, electrical engineers, and those working in the lighting, consumer electronics, automotive, aviation, and communications sectors. Features new chapters on laser lighting, addressing the latest advances on this topic Reviews fabrication, performance, and applications of this technology that encompass the state-of-the-art material and device development Covers the performance of nitride LEDs, including photonic crystal LEDs, surface plasmon enhanced LEDs, color tuneable LEDs, and LEDs based on quantum wells and quantum dots Highlights applications of nitride LEDs, including liquid crystal display (LCD) backlighting, infra-red emitters, and automotive lighting Provides a comprehensive discussion of gallium nitride on both silicon and s

Solid State Lighting Reliability Part 2 Book

Solid State Lighting Reliability Part 2


  • Author : Willem Dirk van Driel
  • Publisher : Springer
  • Release Date : 2017-07-11
  • Genre: Technology & Engineering
  • Pages : 606
  • ISBN 10 : 9783319581750

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Solid State Lighting Reliability Part 2 Excerpt :

In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new and unknown failure modes have also been presented. In this book, Solid State Lighting Reliability Part 2, we invited the experts from industry and academia to present the latest developments and findings in the LED system reliability arena. Topics in this book cover the early failures and critical steps in LED manufacturing; advances in reliability testing and standards; quality of colour and colour stability; degradation of optical materials and the associated chromaticity maintenance; characterization of thermal interfaces; LED solder joint testing and prediction; common failure modes in LED drivers; root causes for lumen depreciation; corrosion sensitivity of LED packages; reliability management for automotive LEDs, and lightning effects on LEDs. This book is a continuation of Solid State Lighting Reliability: Components to Systems (published in 2013), which covers reliability aspects ranging from the LED to the total luminaire or system of luminaires. Together, these two books are a full set of reference books for Solid State Lighting reliability from the performance of the (sub-) components to the total system, regardless its complexity.

Solid State Lighting Reliability Book

Solid State Lighting Reliability


  • Author : W.D. van Driel
  • Publisher : Springer Science & Business Media
  • Release Date : 2012-09-06
  • Genre: Technology & Engineering
  • Pages : 618
  • ISBN 10 : 9781461430674

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Solid State Lighting Reliability Excerpt :

Solid State Lighting Reliability: Components to Systems begins with an explanation of the major benefits of solid state lighting (SSL) when compared to conventional lighting systems including but not limited to long useful lifetimes of 50,000 (or more) hours and high efficacy. When designing effective devices that take advantage of SSL capabilities the reliability of internal components (optics, drive electronics, controls, thermal design) take on critical importance. As such a detailed discussion of reliability from performance at the device level to sub components is included as well as the integrated systems of SSL modules, lamps and luminaires including various failure modes, reliability testing and reliability performance. A follow-up, Solid State Lighting Reliability Part 2, was published in 2017.

Reliability Investigation of Led Devices for Public Light Applications Book

Reliability Investigation of Led Devices for Public Light Applications


  • Author : Raphael Baillot
  • Publisher : Iste Press - Elsevier
  • Release Date : 2017-03-06
  • Genre: Uncategoriezed
  • Pages : 222
  • ISBN 10 : 1785481495

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Reliability Investigation of Led Devices for Public Light Applications Excerpt :

Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved. Based on the work of two main Phd results in 2011 and 2014 Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model Proposes the technology and methodologies to understand failure mechanisms

mm Wave Silicon Power Amplifiers and Transmitters Book

mm Wave Silicon Power Amplifiers and Transmitters


  • Author : Hossein Hashemi
  • Publisher : Cambridge University Press
  • Release Date : 2016-04-04
  • Genre: Technology & Engineering
  • Pages : 471
  • ISBN 10 : 9781107055865

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mm Wave Silicon Power Amplifiers and Transmitters Excerpt :

Build high-performance, energy-efficient circuits with this cutting-edge guide to designing, modeling, analysing, implementing and testing new mm-wave systems.

Reliability of Organic Compounds in Microelectronics and Optoelectronics Book

Reliability of Organic Compounds in Microelectronics and Optoelectronics


  • Author : Willem Dirk van Driel
  • Publisher : Springer Nature
  • Release Date : 2022
  • Genre: Electronic books
  • Pages : 552
  • ISBN 10 : 9783030815769

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Reliability of Organic Compounds in Microelectronics and Optoelectronics Excerpt :

This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors.

Embedded Systems Book

Embedded Systems


  • Author : James K. Peckol
  • Publisher : John Wiley & Sons
  • Release Date : 2019-04-01
  • Genre: Computers
  • Pages : 1080
  • ISBN 10 : 9781119457497

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Embedded Systems Excerpt :

Embedded Systems: A Contemporary Design Tool, Second Edition Embedded systems are one of the foundational elements of today’s evolving and growing computer technology. From operating our cars, managing our smart phones, cleaning our homes, or cooking our meals, the special computers we call embedded systems are quietly and unobtrusively making our lives easier, safer, and more connected. While working in increasingly challenging environments, embedded systems give us the ability to put increasing amounts of capability into ever-smaller and more powerful devices. Embedded Systems: A Contemporary Design Tool, Second Edition introduces you to the theoretical hardware and software foundations of these systems and expands into the areas of signal integrity, system security, low power, and hardware-software co-design. The text builds upon earlier material to show you how to apply reliable, robust solutions to a wide range of applications operating in today’s often challenging environments. Taking the user’s problem and needs as your starting point, you will explore each of the key theoretical and practical issues to consider when designing an application in today’s world. Author James Peckol walks you through the formal hardware and software development process covering: Breaking the problem down into major functional blocks; Planning the digital and software architecture of the system; Utilizing the hardware and software co-design process; Designing the physical world interface to external analog and digital signals; Addressing security issues as an integral part of the design process; Managing signal integrity problems and reducing power demands in contemporary systems; Debugging and testing throughout the design and development cycle; Improving performance. Stressing the importance of security, safety, and reliability in the design and development of embedded systems and providing a balanced treatment of both the hardware and the software aspects, Embedded Syst

Electrostatic Discharge Protection Book

Electrostatic Discharge Protection


  • Author : Juin J. Liou
  • Publisher : CRC Press
  • Release Date : 2017-12-19
  • Genre: Technology & Engineering
  • Pages : 304
  • ISBN 10 : 9781482255898

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Electrostatic Discharge Protection Excerpt :

Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.

Nitride Semiconductor Technology Book

Nitride Semiconductor Technology


  • Author : Fabrizio Roccaforte
  • Publisher : John Wiley & Sons
  • Release Date : 2020-07-17
  • Genre: Technology & Engineering
  • Pages : 464
  • ISBN 10 : 9783527825257

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Nitride Semiconductor Technology Excerpt :

The book "Nitride Semiconductor Technology" provides an overview of nitride semiconductors and their uses in optoelectronics and power electronics devices. It explains the physical properties of those materials as well as their growth methods. Their applications in high electron mobility transistors, vertical power devices, LEDs, laser diodes, and vertical-cavity surface-emitting lasers are discussed in detail. The book further examines reliability issues in these materials and puts forward perspectives of integrating them with 2D materials for novel high-frequency and high-power devices. In summary, it covers nitride semiconductor technology from materials to devices and provides the basis for further research.

Proceedings Book

Proceedings


  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1998
  • Genre: Gallium arsenide semiconductors
  • Pages : 134
  • ISBN 10 : UOM:39015047360857

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Proceedings Excerpt :

Scientific and Technical Aerospace Reports Book

Scientific and Technical Aerospace Reports


  • Author : Anonim
  • Publisher : Unknown
  • Release Date : 1982
  • Genre: Aeronautics
  • Pages : 648
  • ISBN 10 : UIUC:30112104409450

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Scientific and Technical Aerospace Reports Excerpt :

Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.

HEMT Technology and Applications Book

HEMT Technology and Applications


  • Author : Trupti Ranjan Lenka
  • Publisher : Springer Nature
  • Release Date : 2022-06-23
  • Genre: Technology & Engineering
  • Pages : 245
  • ISBN 10 : 9789811921650

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HEMT Technology and Applications Excerpt :

This book covers two broad domains: state-of-the-art research in GaN HEMT and Ga2O3 HEMT. Each technology covers materials system, band engineering, modeling and simulations, fabrication techniques, and emerging applications. The book presents basic operation principles of HEMT, types of HEMT structures, and semiconductor device physics to understand the device behavior. The book presents numerical modeling of the device and TCAD simulations for high-frequency and high-power applications. The chapters include device characteristics of HEMT including 2DEG density, Id-Vgs, Id-Vds, transconductance, linearity, and C-V. The book emphasizes the state-of-the-art fabrication techniques of HEMT and circuit design for various applications in low noise amplifier, oscillator, power electronics, and biosensor applications. The book focuses on HEMT applications to meet the ever-increasing demands of the industry, innovation in terms of materials, design, modeling, simulation, processes, and circuits. The book will be primarily helpful to undergraduate/postgraduate, researchers, and practitioners in their research.

ESD Book

ESD


  • Author : Steven H. Voldman
  • Publisher : John Wiley & Sons
  • Release Date : 2005-12-13
  • Genre: Technology & Engineering
  • Pages : 420
  • ISBN 10 : 9780470012901

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ESD Excerpt :

This volume is the first in a series of three books addressing Electrostatic Discharge (ESD) physics, devices, circuits and design across the full range of integrated circuit technologies. ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. An invaluable reference for EMC non-specialist engineers and researchers working in the fields of IC and transistor design. Also, suitable for researchers and advanced students in the fields of device/circuit modelling and semiconductor reliability.