System on Chip Test Architectures Book

System on Chip Test Architectures


  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Release Date : 2010-07-28
  • Genre: Technology & Engineering
  • Pages : 896
  • ISBN 10 : 0080556809

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System on Chip Test Architectures Excerpt :

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Introduction to Advanced System on Chip Test Design and Optimization Book
Score: 3
From 1 Ratings

Introduction to Advanced System on Chip Test Design and Optimization


  • Author : Erik Larsson
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-03-30
  • Genre: Technology & Engineering
  • Pages : 388
  • ISBN 10 : 9780387256245

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Introduction to Advanced System on Chip Test Design and Optimization Excerpt :

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Design and Test Technology for Dependable Systems on chip Book

Design and Test Technology for Dependable Systems on chip


  • Author : Raimund Ubar
  • Publisher : IGI Global
  • Release Date : 2011-01-01
  • Genre: Computers
  • Pages : 550
  • ISBN 10 : 9781609602147

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Design and Test Technology for Dependable Systems on chip Excerpt :

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

VLSI SOC  From Systems to Chips Book

VLSI SOC From Systems to Chips


  • Author : Manfred Glesner
  • Publisher : Springer
  • Release Date : 2006-08-16
  • Genre: Computers
  • Pages : 314
  • ISBN 10 : 9780387334035

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VLSI SOC From Systems to Chips Excerpt :

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show research results in the field of microelectronics design. The current trend toward increasing chip integration brings about exhilarating new challenges both at the physical and system-design levels: this conference aims to address these exciting new issues. The 2003 edition of VLSI-SoC conserved the traditional structure, which has been successful in previous editions. The quality of submissions (142 papers) made the selection process difficult, but finally 57 papers and 14 posters were accepted for presentation in VLSI-SoC 2003. Submissions came from Austria, Bulgaria, Brazil, Canada, Egypt, England, Estonia, Finland, France, Germany, Greece, Hungary, India, Iran, Israel, Italy, Japan, Korea, Malaysia, Mexico, Netherlands, Poland, Portugal, Romania, Spain, Sweden, Taiwan and the United States of America. From 57 papers presented at the conference, 18 were selected to have an extended and revised version included in this book.

SOC  System on a Chip  Testing for Plug and Play Test Automation Book

SOC System on a Chip Testing for Plug and Play Test Automation


  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-04-17
  • Genre: Technology & Engineering
  • Pages : 200
  • ISBN 10 : 9781475765274

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SOC System on a Chip Testing for Plug and Play Test Automation Excerpt :

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Advances in Electronic Testing Book

Advances in Electronic Testing


  • Author : Dimitris Gizopoulos
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-01-22
  • Genre: Technology & Engineering
  • Pages : 412
  • ISBN 10 : 9780387294094

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Advances in Electronic Testing Excerpt :

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

System on Chip Book

System on Chip


  • Author : Bashir M. Al-Hashimi
  • Publisher : IET
  • Release Date : 2006-01-01
  • Genre: Computers
  • Pages : 911
  • ISBN 10 : 9780863415524

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System on Chip Excerpt :

System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings. The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts in the field. This book covers the general principles of designing, validating and testing complex embedded computing systems and their underlying tradeoffs. The book has twenty five chapters organised into eight parts, each part focuses on a particular topic of SoC. Each chapter has some background covering the basic principles, and extensive list of references. It is aimed at graduate students, designers and managers working in Electronic and Computer engineering.

VLSI SoC  Advanced Topics on Systems on a Chip Book

VLSI SoC Advanced Topics on Systems on a Chip


  • Author : Ricardo Reis
  • Publisher : Springer
  • Release Date : 2009-04-05
  • Genre: Computers
  • Pages : 290
  • ISBN 10 : 9780387895581

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VLSI SoC Advanced Topics on Systems on a Chip Excerpt :

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5 and by the IEEE Council on Electronic Design Automation (CEDA), is to provide a forum to exchange ideas and show industrial and academic research results in the field of microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels, as well in the test of these systems. VLSI-SoC conferences aim to address these exciting new issues.

Essential Issues in SOC Design Book

Essential Issues in SOC Design


  • Author : Youn-Long Steve Lin
  • Publisher : Springer Science & Business Media
  • Release Date : 2007-05-31
  • Genre: Technology & Engineering
  • Pages : 403
  • ISBN 10 : 9781402053528

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Essential Issues in SOC Design Excerpt :

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

Reliability  Availability and Serviceability of Networks on Chip Book

Reliability Availability and Serviceability of Networks on Chip


  • Author : √Črika Cota
  • Publisher : Springer Science & Business Media
  • Release Date : 2011-09-23
  • Genre: Technology & Engineering
  • Pages : 209
  • ISBN 10 : 1461407915

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Reliability Availability and Serviceability of Networks on Chip Excerpt :

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

VLSI Test Principles and Architectures Book
Score: 5
From 1 Ratings

VLSI Test Principles and Architectures


  • Author : Laung-Terng Wang
  • Publisher : Elsevier
  • Release Date : 2006-08-14
  • Genre: Technology & Engineering
  • Pages : 808
  • ISBN 10 : 0080474799

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VLSI Test Principles and Architectures Excerpt :

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Power Aware Testing and Test Strategies for Low Power Devices Book

Power Aware Testing and Test Strategies for Low Power Devices


  • Author : Patrick Girard
  • Publisher : Springer Science & Business Media
  • Release Date : 2010-03-11
  • Genre: Technology & Engineering
  • Pages : 363
  • ISBN 10 : 9781441909282

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Power Aware Testing and Test Strategies for Low Power Devices Excerpt :

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs Book

Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs


  • Author : Brandon Noia
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-11-19
  • Genre: Technology & Engineering
  • Pages : 245
  • ISBN 10 : 9783319023786

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Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs Excerpt :

This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

Information and Business Intelligence Book

Information and Business Intelligence


  • Author : Xilong Qu
  • Publisher : Springer
  • Release Date : 2012-04-25
  • Genre: Computers
  • Pages : 759
  • ISBN 10 : 9783642290848

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Information and Business Intelligence Excerpt :

This two-volume set (CCIS 267 and CCIS 268) constitutes the refereed proceedings of the International Conference on Information and Business Intelligence, IBI 2011, held in Chongqing, China, in December 2011. The 229 full papers presented were carefully reviewed and selected from 745 submissions. The papers address topics such as communication systems; accounting and agribusiness; information education and educational technology; manufacturing engineering; multimedia convergence; security and trust computing; business teaching and education; international business and marketing; economics and finance; and control systems and digital convergence.

The VLSI Handbook Book

The VLSI Handbook


  • Author : Wai-Kai Chen
  • Publisher : CRC Press
  • Release Date : 2018-10-03
  • Genre: Technology & Engineering
  • Pages : 2320
  • ISBN 10 : 9781420005967

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The VLSI Handbook Excerpt :

For the new millenium, Wai-Kai Chen introduced a monumental reference for the design, analysis, and prediction of VLSI circuits: The VLSI Handbook. Still a valuable tool for dealing with the most dynamic field in engineering, this second edition includes 13 sections comprising nearly 100 chapters focused on the key concepts, models, and equations. Written by a stellar international panel of expert contributors, this handbook is a reliable, comprehensive resource for real answers to practical problems. It emphasizes fundamental theory underlying professional applications and also reflects key areas of industrial and research focus. WHAT'S IN THE SECOND EDITION? Sections on... Low-power electronics and design VLSI signal processing Chapters on... CMOS fabrication Content-addressable memory Compound semiconductor RF circuits High-speed circuit design principles SiGe HBT technology Bipolar junction transistor amplifiers Performance modeling and analysis using SystemC Design languages, expanded from two chapters to twelve Testing of digital systems Structured for convenient navigation and loaded with practical solutions, The VLSI Handbook, Second Edition remains the first choice for answers to the problems and challenges faced daily in engineering practice.